Fraunhofer IMWS / 2025
Faster, higher comparability and increased precision in the failure analysis of microelectronic components through the use of AI
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Quality assurance is a key enabler for modern microelectronics which is only possible if powerful techniques for screening, fault isolation and failure diagnostics are available. Machine learning (ML) and artificial intelligence (AI) can strongly support these tasks, however versatile applicable data infrastructures and evaluation algorithms are still not readily available. In the "FA2IR" project, the Fraunhofer Institute for Microstructure of Materials and Systems IMWS in Halle (Saale) is working with partners on solutions to develop and incorporate sophisticated digital tools for paving the digital path for fault analysis. Automated, AI-supported analysis is intended to minimize result-subjectivity, shorten development times and to improve product quality.
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